Issued Patents 2024
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12142537 | Defect measurement method | Burn Jeng Lin, Chrong-Jung Lin, Yi-Pei Tsai | 2024-11-12 |
| 12051466 | Memory cell including programmable resistors with transistor components | Yu-Der Chih, Jonathan Tsung-Yung Chang, Yun-Sheng Chen, Maybe Chen, Wen-Zhang Lin +2 more | 2024-07-30 |
| 12040028 | Low voltage one-time-programmable memory and array thereof | Chrong-Jung Lin, Yao-Hung Huang | 2024-07-16 |
| 12041860 | Resistive memory device and method for manufacturing with protrusion of electrode | Yu-Der Chih, Wen-Zhang Lin, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Chrong-Jung Lin +2 more | 2024-07-16 |
| 12009177 | Detection using semiconductor detector | Chrong-Jung Lin, Burn Jeng Lin, Chien-Ping Wang, Shao-Hua Wang, Chun-Lin Chang +1 more | 2024-06-11 |
| 11943936 | Semiconductor device and method of manufacturing the same | Yu-Der Chih, May-Be Chen, Yun-Sheng Chen, Jonathan Tsung-Yung Chang, Wen-Zhang Lin +3 more | 2024-03-26 |