Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12142537 | Defect measurement method | Chrong-Jung Lin, Ya-Chin King, Yi-Pei Tsai | 2024-11-12 |
| 12009177 | Detection using semiconductor detector | Ya-Chin King, Chrong-Jung Lin, Chien-Ping Wang, Shao-Hua Wang, Chun-Lin Chang +1 more | 2024-06-11 |