Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12111270 | Method of inspecting a wafer and apparatus for performing the same | Juntaek Oh, Kijoo HONG, Youngkyu Park, Eunsoo Hwang | 2024-10-08 |
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Sungil Choi, Yeeun Park, Kyungbeom Kim, Sungyoon Ryu, Sunhong Jun | 2024-03-05 |