Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12092656 | Test apparatus and test method thereof | Seungbum Hong, Kwangeun Kim, Hoon Kim, Jiwon Yeom, Seokjung Yun +3 more | 2024-09-17 |
| 11988495 | Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation | Kwangsoo Kim, Daejun Park, Seong Jin YUN, Seungryeol Oh, Sujin Lee +4 more | 2024-05-21 |
| 11921270 | Inspection system including reference specimen and method of forming semiconductor device | Sungil Choi, Yeeun Park, Kyungbeom Kim, Jinwoo Ahn, Sunhong Jun | 2024-03-05 |