Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12111270 | Method of inspecting a wafer and apparatus for performing the same | Juntaek Oh, Jinwoo Ahn, Kijoo HONG, Eunsoo Hwang | 2024-10-08 |
YP
Youngkyu Park
Overall (2024): #205,618 of 561,600Top 40%
1
Patents 2024