Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12111270 | Method of inspecting a wafer and apparatus for performing the same | Jinwoo Ahn, Kijoo HONG, Youngkyu Park, Eunsoo Hwang | 2024-10-08 |
| 12069419 | Electronic device | Myeounghyeoun Do, Taegyeong Han | 2024-08-20 |