SE

Stefan Eyring

KL Kla: 2 patents #23 of 230Top 10%
📍 Weilburg, DE: #1 of 6 inventorsTop 20%
Overall (2024): #42,409 of 561,600Top 8%
4
Patents 2024

Issued Patents 2024

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
12085385 Design-assisted large field of view metrology Frank Laske 2024-09-10
12055859 Overlay mark design for electron beam overlay Inna Steely-Tarshish, Mark Ghinovker, Yoel Feler, Eitan Hajaj, Ulrich Pohlmann +4 more 2024-08-06
11894214 Detection and correction of system responses in real-time Henning Stoschus, Christopher T. Sears 2024-02-06
11862524 Overlay mark design for electron beam overlay Inna Steely-Tarshish, Mark Ghinovker, Yoel Feler, Eitan Hajaj, Ulrich Pohlmann +4 more 2024-01-02