Issued Patents 2024
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183541 | Charged particle beam system and overlay misalignment measurement method | — | 2024-12-31 |
| 12174551 | Pattern measurement device and pattern measurement method | Hiroya Ohta, Kenji Tanimoto, Yusuke Abe, Tomohiro Tamori, Masaaki Nojiri | 2024-12-24 |
| 12176181 | Pattern inspecting device | Wei Sun, Yasunori Goto, Makoto Sakakibara | 2024-12-24 |
| 12142457 | Charged particle beam device | Takahiro Nishihata, Mayuka Osaki, Yuji Takagi, Makoto Suzuki | 2024-11-12 |
| 12118164 | Touch panel system, display device, and method for controlling touch panel for detecting position and pressure of input | Takenori Maruyama, Kazutoshi Kida, Shinji Yamagishi, Yasuhiro Sugita, Hiroshi Fukushima | 2024-10-15 |
| 11972084 | Touch panel system capable of determining a pressing force and display device with the touch panel system | Shinji Yamagishi, Takenori Maruyama, Kazutoshi Kida, Yasuhiro Sugita, Hiroshi Fukushima | 2024-04-30 |
| 11886393 | Information processing device, information processing system, and non-transitory computer readable medium | Kohei Kaibara, Toru Takahashi, Masakazu Ketsuka, Mitsuru Sato | 2024-01-30 |