Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176181 | Pattern inspecting device | Wei Sun, Yasunori Goto, Takuma Yamamoto | 2024-12-24 |
| 12125667 | Charged particle beam device | Yasuhiro Shirasaki, Momoyo Enyama, Hajime Kawano, Akira Ikegami | 2024-10-22 |
| 12057288 | Charged particle beam device and inspection method | Momoyo Enyama, Hajime Kawano | 2024-08-06 |
| 11967482 | Charged particle beam device | Wen Li, Hajime Kawano, Momoyo Enyama | 2024-04-23 |