Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174551 | Pattern measurement device and pattern measurement method | Takuma Yamamoto, Kenji Tanimoto, Yusuke Abe, Tomohiro Tamori, Masaaki Nojiri | 2024-12-24 |
| 11869745 | Charged particle beam device | Minami Shouji, Natsuki Tsuno, Daisuke Bizen | 2024-01-09 |