Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174551 | Pattern measurement device and pattern measurement method | Takuma Yamamoto, Hiroya Ohta, Yusuke Abe, Tomohiro Tamori, Masaaki Nojiri | 2024-12-24 |
| 12068128 | Charged particle beam system | Yusuke Nakamura, Yusuke Abe, Takeyoshi Ohashi | 2024-08-20 |