Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112107 | Virtual metrology for wafer result prediction | Jun Shinagawa, Megan Wooley, Toshihiro KITAO | 2024-10-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112107 | Virtual metrology for wafer result prediction | Jun Shinagawa, Megan Wooley, Toshihiro KITAO | 2024-10-08 |