Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112260 | Metrology apparatus and method for determining a characteristic of one or more structures on a substrate | Lorenzo Tripodi, Patrick Warnaar, Grzegorz Grzela, Farzad Farhadzadeh, Patricius Aloysius Jacobus Tinnemans +5 more | 2024-10-08 |
| 12105432 | Metrology method and associated computer product | Narjes JAVAHERI, Maurits Van Der Schaar, Tieh-Ming Chang, Hilko Dirk Bos, Patrick Warnaar +3 more | 2024-10-01 |