Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12067340 | Computational wafer inspection | Christophe David Fouquet, Bernardo Kastrup, Arie Jeffrey Den Boef, James Benedict Kavanagh, James Patrick Koonmen +1 more | 2024-08-20 |
| 11875966 | Method and apparatus for inspection | Bernardo Kastrup, Marinus Aart Van Den Brink, Jozef Petrus Henricus Benschop, Erwin Paul SMAKMAN, Tamara Druzhinina +1 more | 2024-01-16 |
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Wim Tjibbo Tel, Hermanus Adrianus DILLEN, Marc Jurian Kea, Mark John Maslow, Koen Thuijs +3 more | 2024-01-02 |