Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835866 | Method and system of surface topography measurement for lithography | Yung-Yao Lee, Yang-Ann Chu, Yung-Hsiang Chen, Yung-Cheng Chen | 2023-12-05 |
YW
Yeh-Chin Wang
Overall (2023): #197,716 of 537,848Top 40%
1
Patents 2023