Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11669957 | Semiconductor wafer measurement method and system | Yi-An Huang, Jyun-Hong Chen, Wei-Chung Hu, Wen-Hao Cheng, Shiang-Bau Wang +1 more | 2023-06-06 |
| 11600505 | Systems and methods for systematic physical failure analysis (PFA) fault localization | Wen-Hao Cheng, Jyun-Hong Chen, Chien-Hui Chen | 2023-03-07 |