Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11816411 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Yan Chen, Jun Liu | 2023-11-14 |
MC
Meng Ku Chi
Overall (2023): #330,616 of 537,848Top 65%
1
Patents 2023