Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11816411 | Method and system for semiconductor wafer defect review | Chung-Pin Chou, Chun-Wen Wang, Meng Ku Chi, Jun Liu | 2023-11-14 |
| 11764094 | Semiconductor processing tool and methods of operation | Chung-Pin Chou, Kai-Lin Chuang, Sheng-Wen Huang, Jun Liu | 2023-09-19 |
| 11749571 | System and method for high speed inspection of semiconductor substrates | Sheng-He Huang, Chung-Pin Chou, Shiue-Ming GUO, Hsuan-Chia KAO, Sheng-Ching Kao +1 more | 2023-09-05 |