Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11823961 | Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system | Eunhee Jeang, Sangwoo Bae, Wondon Joo, Maksim Riabko, Anton Sergeevich MEDVEDEV +7 more | 2023-11-21 |