Issued Patents 2023
Showing 26–50 of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11711095 | Bit flipping low-density parity-check decoders with low error floor | Mustafa N. Kaynak | 2023-07-25 |
| 11705925 | Dynamic bit flipping order for iterative error correction | Mustafa N. Kaynak | 2023-07-18 |
| 11693657 | Methods for performing fused-multiply-add operations on serially allocated data within a processing-in-memory capable memory device, and related memory devices and systems | Dmitri Yudanov, Sean S. Eilert, Shivasankar Gunasekaran, Ameen D. Akel | 2023-07-04 |
| 11689217 | Methods and systems of stall mitigation in iterative decoders | Mustafa N. Kaynak | 2023-06-27 |
| 11676666 | Read disturb scan for unprogrammed wordlines | Patrick R. Khayat, Mustafa N. Kaynak | 2023-06-13 |
| 11676664 | Voltage bin selection for blocks of a memory device after power up of the memory device | Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Mustafa N. Kaynak, Karl D. Schuh +2 more | 2023-06-13 |
| 11675529 | Threshold voltage determination for calibrating voltage bins of a memory device | Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Mustafa N. Kaynak | 2023-06-13 |
| 11670396 | Determine bit error count based on signal and noise characteristics centered at an optimized read voltage | Patrick R. Khayat, James Fitzpatrick | 2023-06-06 |
| 11662905 | Memory system performance enhancements using measured signal and noise characteristics of memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien, Violante Moschiano | 2023-05-30 |
| 11663079 | Data recovery using a combination of error correction schemes | Dung Viet Nguyen, Phong Sy Nguyen | 2023-05-30 |
| 11657886 | Intelligent proactive responses to operations to read data from memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2023-05-23 |
| 11632132 | Configuring iterative error correction parameters using criteria from previous iterations | Eyal En Gad, Zhengang Chen, Yoav Weinberg | 2023-04-18 |
| 11620074 | Voltage bin calibration based on a voltage distribution reference voltage | Kishore Kumar Muchherla, Devin M. Batutis, Xiangang Luo, Mustafa N. Kaynak, Peter Feeley +2 more | 2023-04-04 |
| 11609857 | Identification and caching of frequent read disturb aggressors | Saeed Sharifi Tehrani, Aniryudh Reddy Durgam | 2023-03-21 |
| 11593005 | Managing voltage bin selection for blocks of a memory device | Kishore Kumar Muchherla, Mustafa N. Kaynak, Peter Feeley, Sampath K. Ratnam, Shane Nowell +2 more | 2023-02-28 |
| 11586679 | Proactive corrective actions in memory based on a probabilistic data structure | Saeed Sharifi Tehrani | 2023-02-21 |
| 11587639 | Voltage calibration scans to reduce memory device overhead | Kishore Kumar Muchherla, Mustafa N. Kaynak, Xiangang Luo, Peter Feeley, Devin M. Batutis +4 more | 2023-02-21 |
| 11587638 | Read model of memory cells using information generated during read operations | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2023-02-21 |
| 11587627 | Determining voltage offsets for memory read operations | Kishore Kumar Muchherla, Mustafa N. Kaynak, Sampath K. Ratnam, Shane Nowell, Peter Feeley | 2023-02-21 |
| 11587624 | Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operations | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2023-02-21 |
| 11581047 | Iterative read calibration enhanced according to patterns of shifts in read voltages | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2023-02-14 |
| 11562793 | Read soft bits through boosted modulation following reading hard bits | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2023-01-24 |
| 11562801 | Determine signal and noise characteristics centered at an optimized read voltage | Patrick R. Khayat, James Fitzpatrick | 2023-01-24 |
| 11556417 | Reduction of errors in data retrieved from a memory device to apply an error correction code of a predetermined code rate | Kishore Kumar Muchherla, Akira Goda, Mustafa N. Kaynak | 2023-01-17 |
| 11557361 | Compute an optimized read voltage | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2023-01-17 |