Issued Patents 2023
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11689217 | Methods and systems of stall mitigation in iterative decoders | Sivagnanam Parthasarathy | 2023-06-27 |
| 11676664 | Voltage bin selection for blocks of a memory device after power up of the memory device | Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy, Karl D. Schuh +2 more | 2023-06-13 |
| 11676666 | Read disturb scan for unprogrammed wordlines | Sivagnanam Parthasarathy, Patrick R. Khayat | 2023-06-13 |
| 11675529 | Threshold voltage determination for calibrating voltage bins of a memory device | Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy | 2023-06-13 |
| 11664080 | Bin placement according to program-erase cycles | Michael Sheperek, Steven Michael Kientz | 2023-05-30 |
| 11620074 | Voltage bin calibration based on a voltage distribution reference voltage | Kishore Kumar Muchherla, Devin M. Batutis, Xiangang Luo, Peter Feeley, Sivagnanam Parthasarathy +2 more | 2023-04-04 |
| 11609846 | Managing workload of programming sets of pages to memory device | Kishore Kumar Muchherla, Karl D. Schuh, Jiangang Wu, Devin M. Batutis, Xiangang Luo | 2023-03-21 |
| 11593005 | Managing voltage bin selection for blocks of a memory device | Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Shane Nowell, Sivagnanam Parthasarathy +2 more | 2023-02-28 |
| 11587627 | Determining voltage offsets for memory read operations | Kishore Kumar Muchherla, Sampath K. Ratnam, Shane Nowell, Peter Feeley, Sivagnanam Parthasarathy | 2023-02-21 |
| 11587639 | Voltage calibration scans to reduce memory device overhead | Kishore Kumar Muchherla, Sivagnanam Parthasarathy, Xiangang Luo, Peter Feeley, Devin M. Batutis +4 more | 2023-02-21 |
| 11556417 | Reduction of errors in data retrieved from a memory device to apply an error correction code of a predetermined code rate | Sivagnanam Parthasarathy, Kishore Kumar Muchherla, Akira Goda | 2023-01-17 |