Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709474 | Method and apparatus for detecting abnormality of manufacturing facility | Hyun Chui Kang, Ho Jin Park, Eun Seo LEE | 2023-07-25 |
JS
Ji Yeon SON
Overall (2023): #395,392 of 537,848Top 75%
1
Patents 2023