Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709474 | Method and apparatus for detecting abnormality of manufacturing facility | Hyun Chui Kang, Ho Jin Park, Ji Yeon SON | 2023-07-25 |
EL
Eun Seo LEE
Overall (2023): #450,688 of 537,848Top 85%
1
Patents 2023