Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709474 | Method and apparatus for detecting abnormality of manufacturing facility | Ho Jin Park, Ji Yeon SON, Eun Seo LEE | 2023-07-25 |
HK
Hyun Chui Kang
Overall (2023): #418,032 of 537,848Top 80%
1
Patents 2023