Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Robert J. Rathert, Chet V. Lenox, Oreste Donzella, Kara L. Sherman | 2023-09-12 |