Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11798827 | Systems and methods for semiconductor adaptive testing using inline defect part average testing | Robert J. Rathert, David W. Price, Oreste Donzella, Kara L. Sherman, John Robinson | 2023-10-24 |
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Robert J. Rathert, Robert Cappel, Oreste Donzella, Kara L. Sherman | 2023-09-12 |
| 11656274 | Systems and methods for evaluating the reliability of semiconductor die packages | Robert J. Rathert, David W. Price, Oreste Donzella | 2023-05-23 |
| 11624775 | Systems and methods for semiconductor defect-guided burn-in and system level tests | Robert J. Rathert, David W. Price, Oreste Donzella, John Robinson | 2023-04-11 |
| 11614480 | System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures | David W. Price, Robert J. Rathert, Oreste Donzella, John Robinson | 2023-03-28 |