Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11798827 | Systems and methods for semiconductor adaptive testing using inline defect part average testing | Robert J. Rathert, David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson | 2023-10-24 |
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Robert J. Rathert, Chet V. Lenox, Robert Cappel, Oreste Donzella | 2023-09-12 |