Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11791127 | System and method for bare wafer inspection | Wei Fang | 2023-10-17 |
| 11784024 | Multi-cell detector for charged particles | Yongxin Wang, Zhongwei Chen, Xuerang Hu | 2023-10-10 |