Issued Patents 2023
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835572 | Usage metering by bias temperature instability | — | 2023-12-05 |
| 11804411 | Secure inspection and marking of semiconductor wafers for trusted manufacturing thereof | — | 2023-10-31 |
| 11789069 | Mixed high-resolution and low-resolution inspection for tamper detection | — | 2023-10-17 |
| 11789064 | Decoupling BTI and HCI mechanism in ring oscillator | Huimei Zhou, Liqiao Qin, Miaomiao Wang | 2023-10-17 |
| 11789062 | Usage metering to prevent IC counterfeit | — | 2023-10-17 |
| 11761903 | Wafer inspection and verification | — | 2023-09-19 |
| 11744065 | Read-only memory for chip security that is MOSFET process compatible | Tenko Yamashita | 2023-08-29 |
| 11735480 | Transistor having source or drain formation assistance regions with improved bottom isolation | Ruilong Xie, Alexander Reznicek, Jingyun Zhang | 2023-08-22 |
| 11734461 | Digital logic locking of analog circuits | — | 2023-08-22 |
| 11695005 | Fabricating gate-all-around transistors having high aspect ratio channels and reduced parasitic capacitance | — | 2023-07-04 |
| 11688796 | Gate all around fin field effect transistor | — | 2023-06-27 |
| 11668657 | Secure semiconductor wafer inspection utilizing film thickness | — | 2023-06-06 |
| 11652009 | Secure inspection and marking of semiconductor wafers for trusted manufacturing thereof | — | 2023-05-16 |
| 11646222 | Multifunction single via patterning | — | 2023-05-09 |
| 11574694 | Kernel sets normalization with capacitor charge sharing | Tayfun Gokmen, Xiao Sun, Yulong Li, Malte Johannes Rasch | 2023-02-07 |
| 11556763 | Multi-kernel configuration for convolutional neural networks | Malte Johannes Rasch, Xiao Sun, Yulong Li, Zhibin Ren | 2023-01-17 |