DE

Daniel C. Edelstein

TE Tessera: 1 patents #22 of 63Top 35%
IBM: 1 patents #2,552 of 6,852Top 40%
Overall (2023): #163,903 of 537,848Top 35%
2
Patents 2023

Issued Patents 2023

Patent #TitleCo-InventorsDate
11804405 Method of forming copper interconnect structure with manganese barrier layer Son V. Nguyen, Takeshi Nogami, Deepika Priyadarshini, Hosadurga Shobha 2023-10-31
11557482 Electrode with alloy interface Chih-Chao Yang, Chao-Kun Hu, Oscar van der Straten 2023-01-17