Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11631568 | Device defect detection method using a charged particle beam | Natsuki Tsuno, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2023-04-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11631568 | Device defect detection method using a charged particle beam | Natsuki Tsuno, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2023-04-18 |