Issued Patents 2023
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11776103 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka | 2023-10-03 |
| 11749494 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2023-09-05 |
| 11694325 | System for deriving electrical characteristics and non-transitory computer-readable medium | Heita Kimizuka, Yohei Nakamura, Muneyuki Fukuda | 2023-07-04 |
| 11646172 | Charged particle beam apparatus | Takafumi Miwa, Yohei Nakamura, Heita Kimizuka, Muneyuki Fukuda | 2023-05-09 |
| 11631568 | Device defect detection method using a charged particle beam | Yasuhiro Shirasaki, Minami Shouji, Yohei Nakamura, Muneyuki Fukuda | 2023-04-18 |
| 11610754 | Charged particle beam device | Katsura Takaguchi, Yohei Nakamura, Masahiro Sasajima, Toshihide Agemura | 2023-03-21 |