Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714120 | Semiconductor inspection device | Tomonori Nakamura | 2023-08-01 |
| 11573251 | Semiconductor sample inspection device and inspection method | Yuji Nakajima, Toshiki Yamada | 2023-02-07 |