Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11573251 | Semiconductor sample inspection device and inspection method | Yoshitaka Iwaki, Toshiki Yamada | 2023-02-07 |
| 11550313 | Equipment element maintenance analysis system and equipment element maintenance analysis method | Hitoshi Komatsu, Manabu Ohuchi, Kazuyuki Yoshidomi, Noritada Kawamoto, Hirofumi Koga | 2023-01-10 |