Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11841381 | Wafer inspection method and inspection apparatus | Tsun-I Wang, I-Shih Tseng, Min-Hung Chang | 2023-12-12 |
| 11573265 | Electrical component testing method and test probe | Min-Hung Chang, Ching-Lin Lee, Chin-Yuan Chang, Cheng-Hung Pan, Mao-Sheng LIU | 2023-02-07 |