Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11841381 | Wafer inspection method and inspection apparatus | Tsun-I Wang, I-Shih Tseng, Tzu-Tu Chao | 2023-12-12 |
| 11573265 | Electrical component testing method and test probe | Ching-Lin Lee, Chin-Yuan Chang, Cheng-Hung Pan, Mao-Sheng LIU, Tzu-Tu Chao | 2023-02-07 |