Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579170 | Probe apparatus | Chun-Hao Hu, Hsueh-Cheng Hsieh, Ming-Hui Chen | 2023-02-14 |
| 11573265 | Electrical component testing method and test probe | Min-Hung Chang, Ching-Lin Lee, Cheng-Hung Pan, Mao-Sheng LIU, Tzu-Tu Chao | 2023-02-07 |