Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11848172 | Method for measuring a sample and microscope implementing the method | Dmitry Klochkov, Chuong Huynh, Alex Buxbaum, Amir Avishai | 2023-12-19 |
| 11810749 | Charged particle beam system, method of operating a charged particle beam system, method of recording a plurality of images and computer programs for executing the methods | Eugen Foca, Amir Avishai, Daniel Fischer | 2023-11-07 |
| 11728130 | Method of recording an image using a particle microscope | Dirk Zeidler, Philipp Huethwohl, Jens Timo Neumann, Christof Riedesel, Christian Wojek +2 more | 2023-08-15 |