Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11848172 | Method for measuring a sample and microscope implementing the method | Dmitry Klochkov, Chuong Huynh, Thomas Korb, Alex Buxbaum | 2023-12-19 |
| 11810749 | Charged particle beam system, method of operating a charged particle beam system, method of recording a plurality of images and computer programs for executing the methods | Eugen Foca, Thomas Korb, Daniel Fischer | 2023-11-07 |