Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11728130 | Method of recording an image using a particle microscope | Dirk Zeidler, Thomas Korb, Philipp Huethwohl, Jens Timo Neumann, Christian Wojek +2 more | 2023-08-15 |
| 11645740 | Method for detector equalization during the imaging of objects with a multi-beam particle microscope | Dirk Zeidler, Michael Behnke, Stefan Schubert | 2023-05-09 |
| 11562881 | Charged particle beam system | Dirk Zeidler, Stefan Schubert, Ingo Mueller, Joerg Jacobi, Mario Muetzel +1 more | 2023-01-24 |