Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11657999 | Particle beam system and method for the particle-optical examination of an object | Dirk Zeidler | 2023-05-23 |
| 11645740 | Method for detector equalization during the imaging of objects with a multi-beam particle microscope | Dirk Zeidler, Michael Behnke, Christof Riedesel | 2023-05-09 |
| 11562881 | Charged particle beam system | Dirk Zeidler, Ingo Mueller, Joerg Jacobi, Mario Muetzel, Antonio Casares +1 more | 2023-01-24 |