Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11803127 | Method for determining root cause affecting yield in a semiconductor manufacturing process | Chenxi Lin, Cyrus E. Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov +5 more | 2023-10-31 |
| 11635699 | Determining pattern ranking based on measurement feedback from printed substrate | Maxime Philippe Frederic Genin, Cong Wu, Jing Su, Weixuan HU, Yi Zou | 2023-04-25 |
| 11568123 | Method for determining an etch profile of a layer of a wafer for a simulation system | Chi-Hsiang Fan, Feng Chen, Wangshi Zhao | 2023-01-31 |