Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11803127 | Method for determining root cause affecting yield in a semiconductor manufacturing process | Chenxi Lin, Cyrus E. Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov +5 more | 2023-10-31 |
| 11635699 | Determining pattern ranking based on measurement feedback from printed substrate | Youping Zhang, Cong Wu, Jing Su, Weixuan HU, Yi Zou | 2023-04-25 |