Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11796920 | Method for controlling a manufacturing process and associated apparatuses | Jochem Sebastiaan Wildenberg, Fan Feng, Ronald Van Ittersum, Willem Louis VAN MIERLO, Koen Thuijs | 2023-10-24 |
| 11733614 | Method of metrology and associated apparatuses | Thomas Jarik HUISMAN, Ruben Cornelis MAAS | 2023-08-22 |
| 11668661 | Inspection tool and inspection method | Thomas Jarik HUISMAN, Sander Frederik Wuister, Dorothea Maria Christina Oorschot | 2023-06-06 |
| 11646174 | Method for calibrating a scanning charged particle microscope | Wim Tjibbo Tel, Willem Louis VAN MIERLO | 2023-05-09 |