Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668661 | Inspection tool and inspection method | Thomas Jarik HUISMAN, Hermanus Adrianus DILLEN, Dorothea Maria Christina Oorschot | 2023-06-06 |
| 11635696 | Imprint lithography | Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars +5 more | 2023-04-25 |
| 11625520 | Systems and methods for predicting layer deformation | Chrysostomos BATISTAKIS, Scott Anderson Middlebrooks | 2023-04-11 |