Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740560 | Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process | Carlo LANCIA, Juan Manuel Gonzalez Huesca, Alexander Ypma, Dimitra GKOROU, Reza SAHRAEIAN | 2023-08-29 |