Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740560 | Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process | Eleftherios KOULIERAKIS, Carlo LANCIA, Juan Manuel Gonzalez Huesca, Alexander Ypma, Reza SAHRAEIAN | 2023-08-29 |
| 11579534 | Extracting a feature from a data set | Maialen LARRANAGA, Faegheh Hasibi, Alexander Ypma | 2023-02-14 |