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Chang-Wei Chen

VL Visera Technologies Company Limited: 2 patents #1 of 17Top 6%
AB Asml Netherlands B.V.: 1 patents #206 of 680Top 35%
📍 Cedar Park, TX: #46 of 228 inventorsTop 25%
🗺 Texas: #1,731 of 16,454 inventorsTop 15%
Overall (2022): #86,863 of 548,613Top 20%
3
Patents 2022

Issued Patents 2022

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11448973 Computational metrology based correction and control Manouk RIJPSTRA, Cornelis Johannes Henricus LAMBREGTS, Wim Tjibbo Tel, Sarathi ROY, Cédric Désiré Grouwstra +3 more 2022-09-20
11358168 Coating apparatus Shao-Wei Ma 2022-06-14
11231533 Optical element having dielectric layers formed by ion-assisted deposition and method for fabricating the same Chih-Yu Chen, Chen-Yi Wu 2022-01-25