Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11294293 | Overlay marks for reducing effect of bottom layer asymmetry | Kai-Hsiung Chen, Po-Chung Cheng | 2022-04-05 |
| 11288019 | Memory management method and storage controller | Hsiu-Hsien Chu, Yu-Hua Hsiao | 2022-03-29 |
| 11275314 | Method and apparatus for diffraction-based overlay measurement | Yen-Liang Chen | 2022-03-15 |