Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11487157 | Display device | Chin-Lung Ting, Ming-Hui Chu, Fang-Ho LIN, Chia-Lun Chen | 2022-11-01 |
| 11449984 | Method and system for diagnosing a semiconductor wafer | Jun Liu | 2022-09-20 |
| 11275314 | Method and apparatus for diffraction-based overlay measurement | Hung-Chih Hsieh | 2022-03-15 |
| 11251753 | Envelope tracking supply modulator with zero peaking and associated envelope tracking calibration method and system | Chen-Yen Ho, Chien-Wei Kuan | 2022-02-15 |
| 11243475 | Overlay measurement structures with variable width/pitch for measuring overlay errors | — | 2022-02-08 |